OE-4001 Relative Intensity Noise Analyzer

OEwaves OE-4001 RIN measurement system is capable of automatically and rapidly measuring relative intensity noise spectrum without complex setup.

The OE-4001 RIN measurement system is unique in wideband measurement. The complete system operates with ease, speed and precision via a simple graphic user interface on a dedicated PC. No additional test equipment required. The unmatched ultra-low relative intensity noise analyzer is scalable to various input wavelength bands and is available with multiple frequency range options. This system is ideal for manufacturing and research environments.

Main specifications

 MINTYPMAXUNIT
Operational Wavelength7402150nm
Input+5+15dBm
Frequency range0.118 / 27 / 40GHz
RIN noise floor0.1-160dBc/Hz
Size3U x 19''
Phase Noise Measurement

Applications

Related Product

Documentation

+ 33-(0)685 -220-115 / info@morephotonics.com