OE-4000 Phase Noise – Linewidth Analyzer

OE-4000 laser phase noise and linewidth analyzer system product is designed to achieve ultra-low absolute phase noise measurement capability and to simplify such measurements of continuous wave (CW) laser sources.

The OE-4000 laser phase noise analyzer system is capable of ultra-narrow linewidth analysis without requiring any separate low phase noise reference source or other test equipment. No complicated setup and operation are required to quickly make the measurement at any wavelength within the specified bandwidth of operation.

The unmatched ultra-low phase/frequency noise analyzer is scalable to various input wavelength bands and is available with low relative intensity noise (RIN) measurement option.

Main specifications

 MINTYPMAXUNIT
Operational Wavelength6002200nm
Input-10+15dBm
Linewidth310 EE6Hz
Size3U x 19''
Phase Noise Measurement

Applications

Related Product

Documentation

+ 33-(0)685 -220-115 / info@morephotonics.com